/24-7PressRelease/ - SANTA CLARA, CA, September 13, 2007 - SiGlaz announced today that the company has signed an agreement giving FSM exclusive rights to distribute SiGlaz Intelligent Defect Analysis (IDA) software and its other software products in Korea. SiGlaz has also granted FSM non-exclusive rights to distribute SiGlaz products in the U.S. and Europe.
According to John Poreda, SiGlaz Vice President of Sales and Marketing, "We are very pleased to have FSM representing and supporting SiGlaz products. FSM has a strong sales and product support team that will help us to penetrate some geographical areas in which SiGlaz has not had a visible market presence. In addition, FSM has a wide range of advanced metrology products, and are well-positioned within leading edge fabs to understand the customer requirements for automated analysis of inspection, electrical test and metrology data. We look forward to a long and successful relationship with them."
FSM President, Ann Koo, agrees that there is a good fit between SiGlaz and FSM. "In only two years, SiGlaz has made some outstanding progress in terms of penetrating the Asian market with a spatial signature analysis product for wafer defect analysis. The company has also demonstrated very impressive results in the area of automated analysis of images and complex spatial data, and we see a growing demand for this type of technology, not only for wafer inspection, but for other applications as well."
SiGlaz IDA software is a suite of Windows-based applications for defect spatial signature analysis (DSSA). IDA is used by semiconductor manufacturers to automatically analyze wafer inspection results files in a production environment to notify fab personnel when it recognizes defect spatial signatures that are caused by process excursions.
About SiGlaz
SiGlaz is a developer of image analysis and spatial intelligence software for process monitoring and advanced process control. SiGlaz Intelligent Defect Analysis software is comprised of three modules: Defect Signature Analyzer (DSA), which allows the defect engineer to develop the methodology to analyze defect signatures in KLA results files; Automation Workbench (AWB), which enables the engineer to generate an analysis recipe and to automatically monitor and analyze results files in production; and Intelligent Reporting System, which allows the user to analyze long term defect signature trends and to generate customized reports.
About FSM
Frontier Semiconductor, Inc (FSM), offers a range of advanced metrology products for semiconductor applications, including Measurement Systems for Film Stress, Material Characterization for new films, Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Wafer Substrate Thickness, Whole Wafer Surface Roughness, Non contact Electrical Characterization systems for Sheet Resistance and Leakage Current Measurements for USJ and Metal Contamination, diffusion length measurements for patterned wafers. Systems are supported globally by FSM sales and service team. The company is based in San Jose, CA and is privately held.
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