/24-7PressRelease/ - SANTA CLARA, CA, August 24, 2007 - SiGlaz, a leading provider of spatial signature analysis software to the semiconductor industry, announced today that it has integrated its Intelligent Defect Analysis (IDA) with the Manufacturing Execution System (MES) at the Semiconductor Manufacturing International Corporation (SMIC) in Shanghai.
SiGlaz IDA software automatically classifies defects associated with a known spatial signature. When the performance of the software is compared to a human expert, the average performance of classification at SMIC has been above 90%.
"We appreciate the confidence that SMIC has shown in SiGlaz software. Whenever a customer allows an automated analysis tool to make production decisions, it's a strong indicator of the confidence he has in the accuracy of the analysis," said Victor Luu, President of SiGlaz. "It also shows that the SiGlaz software can be integrated with disparate environments. In this case, the customer is using software from BEA Systems."
After a defect analysis recipe has been optimized, SMIC deploys the recipe to run in continuous monitoring mode within the Fab in a 24 by 7 mode. The recipe automatically connects to MES and sends it messages when a yield loss situation is encountered.
According to a spokesperson for SMIC, "We initially selected SiGlaz IDA software because of its accuracy and flexibility. The performance results to date and the ability to integrate it with MES confirm that we made a good decision."
SMIC has been successful in implementing SiGlaz spatial signature analysis software to automatically identify and classify of defect signatures on semiconductor wafers in a manufacturing environment. SiGlaz' IDA has been running continuously and processing thousands of wafer maps per day for three manufacturing fabs in the Shanghai area. All maps are processed within the prescribed two minutes to hold a lot.
About SiGlaz
SiGlaz is a developer of image analysis and spatial intelligence software for process monitoring and advanced process control. SiGlaz spatial signature analysis (SSA) software enables manufacturers of semiconductors and disk storage media to automatically analyze defect inspection results for spatial signatures. This accelerates root cause analysis and results in improved process yield.
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