/24-7PressRelease/ - SANTA CLARA, CA, August 22, 2007 - SiGlaz, a leading provider of spatial signature analysis software to the semiconductor industry, announced today that it has been accepted by the Microsoft Partner Program as a Certified Partner. This level of certification recognizes SiGlaz technical competence in key areas of software development and system integration, including database management, business intelligence, and business process and integration solutions. The Microsoft Partner program awards points to its development partners, based in large part upon the results obtained in survey taken by the partner's customers.
"We are very pleased to be recognized as a Microsoft Certified Partner," said Victor Luu, President of SiGlaz. "It provides a level of technical credibility when a small company like SiGlaz can achieve this type of recognition, especially when it is based upon feedback from its customers."
SiGlaz' Intelligent Defect Analysis (IDA) software, which is based on Microsoft .NET framework, can be easily integrated into the fab's information system that handles defect inspection results. The IDA software automatically acquires inspection results files from the production database and notifies fab personnel when it identifies a defect spatial signature. IDA analysis results are stored into a data base and available for report generation or trend analysis. SiGlaz has also worked with customers to customize solutions to integrate IDA to the customer's MES software and to report analysis results on a web portal.
In addition, the company has recently started marketing software engineering services to semiconductor equipment companies on an outsourcing basis and believes that achieving Microsoft Certified Partner status will significantly help it to increase revenues in this area. SiGlaz specializes in image processing and automated data analysis.
About SiGlaz
SiGlaz is a developer of image analysis and spatial intelligence software for process monitoring and advanced process control. SiGlaz Intelligent Defect Analysis software is comprised of three modules: Defect Signature Analyzer (DSA), which allows the defect engineer to develop the methodology to analyze defect signatures in KLA results files; Automation Workbench (AWB), which enables the engineer to generate an analysis recipe and to automatically monitor and analyze results files in production; and Intelligent Reporting System, which allows the user to analyze long term defect signature trends and to generate customized reports.
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